Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-11-23T07:15:35.887Z Has data issue: false hasContentIssue false
  • English
  • Français

Evaluating Compositional Variation in InGaAs Random Alloys Using Atom Probe Tomography

Published online by Cambridge University Press:  01 August 2018

Nicole A. Kotulak ,
Mark E. Twigg ,
Nadeemullah A. Mahadik ,
Stephanie Tomasulo ,
P. L. Bonanno ,
N. R. Pereira ,
Keith Knipling  and
Michael K. Yakes
Nicole A. Kotulak
Affiliation:
U.S. Naval Research Laboratory, Washington, DC, USA
Mark E. Twigg
Affiliation:
U.S. Naval Research Laboratory, Washington, DC, USA
Nadeemullah A. Mahadik
Affiliation:
U.S. Naval Research Laboratory, Washington, DC, USA
Stephanie Tomasulo
Affiliation:
U.S. Naval Research Laboratory, Washington, DC, USA
P. L. Bonanno
Affiliation:
ASEE Postdoctoral Associate residing at the U.S. Naval Research Laboratory
N. R. Pereira
Affiliation:
Ecopulse, Inc., Springfield, VA, USA
Keith Knipling
Affiliation:
U.S. Naval Research Laboratory, Washington, DC, USA
Michael K. Yakes
Affiliation:
U.S. Naval Research Laboratory, Washington, DC, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 398 - 399
Copyright
© Microscopy Society of America 2018 

References

[1] Lumb, M. P., et al, Proceedings of SPIE 2012) p. 8256.Google Scholar
[2] Hirst, L. C., et al, J. Appl. Phys. 117 2015) p. 215704.Google Scholar
[3] Hirst, L. C., et al, ACS Nano 11(3 2017) p. 2734.Google Scholar
[4] Kotulak, N. A., et al, Microsc. Microanal. 23(Suppl 1 2017) p. 718.Google Scholar
[5] Kotulak, N. A., et al Proceedings of 43rd IEEE PVSC (2016).Google Scholar
[6] Balades, N., et al, Applied Surface Science 395 2017) p. 98.Google Scholar
[7] Hernandez-Saz, J., et al, Nanotechnology 27 2016) p. 305402.Google Scholar
[8] Peiro, F., et al, J. Appl. Phys. 73 1993) p. 4913.Google Scholar
[9] The authors acknowledge funding support from the Office of Naval Research. P. L. B. held an ASEE Postdoctoral Fellowship at the time this work was performed.Google Scholar