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Etching and High-Resolution Backscatter Electron Imaging for Semi-Automated Segmentation and Stereology of the Gamma Prime Phase in Ni-based Superalloys

Published online by Cambridge University Press:  01 August 2010

EJ Payton
Affiliation:
Ruhr-Universität Bochum, Germany
PJ Phillips
Affiliation:
The Ohio State University
MJ Mills
Affiliation:
The Ohio State University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2010