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Estimating illumination coherence width from focused-probe intensity profiles

Published online by Cambridge University Press:  30 July 2021

Armin Zjajo ,
Itai Matzkevich ,
Aram Rezikyan ,
Hongchu Du  and
Rafal Dunin-Borkowski
Armin Zjajo
Affiliation:
Arizona State University, Phoenix, Arizona, United States
Itai Matzkevich
Affiliation:
Arizona State University, United States
Aram Rezikyan
Affiliation:
Corning, United States
Hongchu Du
Affiliation:
Forschungszentrum Juelich GmbH, United States
Rafal Dunin-Borkowski
Affiliation:
Forchungszentrum Jülich, Nordrhein-Westfalen, Germany

Abstract

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Type
Nanoscale x-ray and Electron Microscopy Techniques and Applications in Material Science
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 738 - 740
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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Radic, D. et al. , Microscopy and Microanalysis, 26, 1100-1109, (2020).CrossRefGoogle Scholar