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Environmental Scanning Electron Microscopy in Transmission Mode

Published online by Cambridge University Press:  01 August 2005

H Dobberstein ,
O A Homsy ,
D E Morrison  and
B L Thiel
H Dobberstein
Affiliation:
University of Cambridge, United Kingdom
O A Homsy
Affiliation:
University of Cambridge, United Kingdom
D E Morrison
Affiliation:
University of Cambridge, United Kingdom
B L Thiel
Affiliation:
University at Albany, New York

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 32 - 33
Copyright
© 2005 Microscopy Society of America