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Energy Dispersive X-ray Spectrum Simulation with NIST DTSA-II: Comparing Simulated and Measured Electron-Excited Spectra

Published online by Cambridge University Press:  22 July 2022

Dale E. Newbury  and
Nicholas W. M. Ritchie
Dale E. Newbury
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD, USA
Nicholas W. M. Ritchie
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD, USA

Abstract

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Type
On Demand - Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 984 - 985
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Copyright
Copyright © Microscopy Society of America 2022

References

Ritchie, N. W. (2010). Microscopy and Microanalysis, 16(3), 248-258.CrossRefGoogle Scholar
Ritchie, N. (2021). NIST DTSA-II software, including tutorials. Available for free at: http://www.cstl.nist.gov/div837/837.02/epq/dtsa2/index.htmlGoogle Scholar
Zaluzec, N. J. (2009). Microscopy and Microanalysis, 15(2), 93-98.CrossRefGoogle Scholar