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Embedded Nanoparticle Analysis using Atom Probe Tomography and High-Resolution Electron Microscopy

Published online by Cambridge University Press:  08 April 2017

S Kuchibhatla ,
V Shutthanandan ,
B Arey ,
L Kovarik ,
C Wang ,
T Prosa ,
R Ulfig ,
S Thevuthasan  and
B Gorman
S Kuchibhatla
Affiliation:
Pacific Northwest National Laboratory
V Shutthanandan
Affiliation:
Pacific Northwest National Laboratory
B Arey
Affiliation:
Pacific Northwest National Laboratory
L Kovarik
Affiliation:
Pacific Northwest National Laboratory
C Wang
Affiliation:
Pacific Northwest National Laboratory
T Prosa
Affiliation:
Cameca Instruments Inc
R Ulfig
Affiliation:
Cameca Instruments Inc
S Thevuthasan
Affiliation:
Pacific Northwest National Laboratory
B Gorman
Affiliation:
Colorado School of Mines

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 760 - 761
Copyright
Copyright © Microscopy Society of America 2011