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Elemental Mapping of Co-Based Magnetic Recording Media: EFTEM and STEM Spectrum Imaging

Published online by Cambridge University Press:  02 July 2020

J. Bentley ,
J.E. Wittig ,
J.F. Al-Sharab  and
N.D. Evans
J. Bentley
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, PO Box 2008, Oak Ridge, TN, 37831-6136
J.E. Wittig
Affiliation:
Dept. of Computer and Electrical Engineering, Vanderbilt University, Nashville, TN, 37235
J.F. Al-Sharab
Affiliation:
Dept. of Computer and Electrical Engineering, Vanderbilt University, Nashville, TN, 37235
N.D. Evans
Affiliation:
Oak Ridge Institute for Science and Education, PO Box 117, Oak Ridge, TN, 37831-0117
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Abstract

The optimized performance of Co(CrTaPt) thin-film longitudinal magnetic recording media (for computer hard discs) depends critically on the grain size distribution and on intergranular Cr segregation that magnetically isolates the grains. These microstructural aspects of both model and commercial media have been extensively investigated at ∽1 nm resolution with quantitative elemental mapping by energy-filtered transmission electron microscopy (EFTEM) of Cr, Co, and O, but not Ta and Pt which unfortunately are not amenable to quantitative elemental mapping by EFTEM. Procedures for data acquisition and processing have been refined in order to provide robust methods for measuring intergranular compositions for statistically significant numbers of grains. Figure 1 shows results obtained with a Gatan imaging filter (GIF) interfaced to a LaB6 Philips CM30 for a carbon-capped 25-nm-thick film of Co80Cr16Ta4 grown on a Cr underlayer. Typical acquisition parameters have been described previously. to avoid the Cr underlayer, foil thicknesses t<0.2X are used, including the carbon overlayer (λ = inelastic mean free path ≌100 nm).

Type
EELS Microanalysis At High Sensitivity: Advances in Spectrum Imaging, Energy Filtering and Detection (Organized by R. Leapman and J. Bruley)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 1140 - 1141
Copyright
Copyright © Microscopy Society of America 2001

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References

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5. Research at the ORNL SHaRE User Facility supported by the Division of Materials Sciences and Engineering, U.S. Department of Energy, under contract DE-AC05-00OR22725 with UT-Battelle, LLC, and through the SHaRE Program under contract DE-AC05-76OR00033 with Oak Ridge Associated Universities. Support from an IBM Faculty Partnership is gratefully acknowledged (JEW).Google Scholar