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Elemental Mapping at Grain Boundaries in Alloy X-750 by EFTEM

Published online by Cambridge University Press:  02 July 2020

J. Bentley ,
N. D. Evans  and
E. A. Kenik
J. Bentley
Affiliation:
Metals & Ceramics Division, Oak Ridge National Laboratory, PO Box 2008, Oak Ridge, TN37831-6376
N. D. Evans
Affiliation:
Oak Ridge Institute for Science and Education, PO Box 117, Oak Ridge, TN37831-0117
E. A. Kenik
Affiliation:
Metals & Ceramics Division, Oak Ridge National Laboratory, PO Box 2008, Oak Ridge, TN37831-6376
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Extract

Alloy X-750 is a γ -strengthened, nickel-base alloy used in demanding high-temperature applications. The HTH commercial heat treatment condition provides excellent strength and good corrosion resistance. However, the resultant precipitate structure is complex with fine (˜20 nm) intragranular γ' phase and copious intergranular precipitation of at least four phases (γ', M23C6, M23B6, and TiN). The intergranular precipitation causes localized grain boundary migration and results in a convoluted grain boundary structure. Such complex grain boundary microstructures increase the difficulty of phase identification and interfacial composition measurements by traditional analytical electron microscopy methods. Elemental mapping by EFTEM is a useful additional or alternative technique for characterizing such structures. A Gatan Imaging Filter (GIF) on a Philips CM30 (LaB6) was used in the current investigation. Experimental details have been summarized elsewhere.

Elemental maps of Cr, Ti, and Ni (net L23 intensities) are presented in Fig. la-c for a typical grain boundary region of a HTH heat treated specimen.

Type
Analytical Electron Microscopy
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 975 - 976
Copyright
Copyright © Microscopy Society of America 1997

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References

1 Kenik, E.A., these proceedings; also Mater. Res. Soc. Symp. Proc. 439, in press.Google Scholar

2 Hall, E.L. and Bentley, J., Mater. Res. Soc. Symp. Proc. 458, in press.Google Scholar

3 Bentley, J.et al. Proc. Microscopy and Microanalysis 1996, 542.CrossRefGoogle Scholar

4 Evans, N.D. and Bentley, J., Proc. Microscopy and Microanalysis 1996, 544.CrossRefGoogle Scholar

5 Research at the ORNL SHaRE User Facility sponsored by the Division of Materials Sciences, U.S. Department of Energy, under contracts DE-AC05-96OR22464 with Lockheed Martin Energy Research Corp., and DE-AC05-76OR00033 with Oak Ridge Associated Universities.Google Scholar