Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-12-02T19:26:53.682Z Has data issue: false hasContentIssue false
  • English
  • Français

Electrostatic Subframing and Compressive Sensing Video in In Situ Transmission Electron Microscopy

Published online by Cambridge University Press:  05 August 2019

B. W. Reed ,
A. A. Moghadam ,
R. S. Bloom ,
S. T. Park ,
A. M. Monterrosa ,
P. M. Price ,
C. M. Barr ,
S. A. Briggs ,
K. Hattar  and
D. J. Masiel
B. W. Reed*
Affiliation:
Integrated Dynamic Electron Solutions, Pleasanton, CA, USA
A. A. Moghadam
Affiliation:
Integrated Dynamic Electron Solutions, Pleasanton, CA, USA
R. S. Bloom
Affiliation:
Integrated Dynamic Electron Solutions, Pleasanton, CA, USA
S. T. Park
Affiliation:
Integrated Dynamic Electron Solutions, Pleasanton, CA, USA
A. M. Monterrosa
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87123, USA
P. M. Price
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87123, USA
C. M. Barr
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87123, USA
S. A. Briggs
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87123, USA Oregon State University, Corvallis, OR 97331, USA
K. Hattar
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87123, USA
D. J. Masiel
Affiliation:
Integrated Dynamic Electron Solutions, Pleasanton, CA, USA
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
In situ TEM Characterization of Dynamic Processes During Materials Synthesis and Processing
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1468 - 1469
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Reed, B. W. et al. , Microsc. Microanal. 24 (suppl. 1), 494 (2018).Google Scholar
[2]This material is based upon work supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Award Number DE-SC0013104. This work was performed, in part, at the Center for Integrated Nanotechnologies, an Office of Science User Facility operated for the U.S. Department of Energy (DOE) Office of Science. Sandia National Laboratories is a multi-mission laboratory managed and operated by National Technology and Engineering Solutions of Sandia, LLC., a wholly owned subsidiary of Honeywell International, Inc., for the U.S. DOE's National Nuclear Security Administration under contract DE-NA-0003525. The views expressed in the article do not necessarily represent the views of the U.S. DOE or the United States Government. Document SAND2019-1905 CGoogle Scholar