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Electrospun Rare-Earth Orthovanadate Scintillator Nanofibers Analyzed by EPMA
Published online by Cambridge University Press: 05 August 2019
Abstract
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- Type
- Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Natural and Synthetic Materials
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- Copyright
- Copyright © Microscopy Society of America 2019
References
[11]This work was supported by NSF PREM program DMR 1827731, and DoD ARO W911NF1810469.Google Scholar