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Electronic Structure Modification of Boron and Nitrogen Ion-Implanted Graphene Fingerprinted by STEM-EELS

Published online by Cambridge University Press:  27 August 2014

D.M. Kepaptsoglou ,
C.R. Seabourne ,
T. Hardcastle ,
R. Nicholls ,
W. Pierce ,
R. Zan ,
U. Bangert ,
A.J. Scott  and
Q.M. Ramasse
D.M. Kepaptsoglou
Affiliation:
SuperSTEM Laboratory, STFC Daresbury Campus, United Kingdom
C.R. Seabourne
Affiliation:
Institute for Materials Research, SPEME, University of Leeds, Leeds, United Kingdom
T. Hardcastle
Affiliation:
Institute for Materials Research, SPEME, University of Leeds, Leeds, United Kingdom
R. Nicholls
Affiliation:
Department of Materials, University of Oxford, Oxford, United Kingdom
W. Pierce
Affiliation:
School of Materials, University of Manchester, Manchester, M13 9PL, United Kingdom
R. Zan
Affiliation:
School of Materials, University of Manchester, Manchester, M13 9PL, United Kingdom
U. Bangert
Affiliation:
School of Materials, University of Manchester, Manchester, M13 9PL, United Kingdom Department of Physics and Energy, University of Limerick, Limerick, Ireland
A.J. Scott
Affiliation:
Institute for Materials Research, SPEME, University of Leeds, Leeds, United Kingdom
Q.M. Ramasse
Affiliation:
SuperSTEM Laboratory, STFC Daresbury Campus, United Kingdom

Abstract

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Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1734 - 1735
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Krivanek, O.L., Chisholm, M.F., Murfitt, M., et al., Ultramicroscopy 123 (2012), p. 90.Google Scholar
[2] Suenaga, K., Sato, Y., Liu, Z., et al., Nature Chem 1 (2009), p. 415-418.Google Scholar
[3] Lovejoy, T. C., Ramasse, Q.M., Falke, M., et al., Appl. Phys. Lett. 100 (2012), 154101.Google Scholar
[4] Ramasse, Q. M., Seabourne, C. R., Kepaptsoglou, D.M., et al., Nano Lett. 12 (8) (2012), p. 3936.Google Scholar
[5] Zhou, W., Kapetanakis, M. D., Prange, M.P., et al., Phys. Rev. Lett. 109 (2012), 206803.Google Scholar
[6] Nicholls, R.J., Murdock, A.T., Tsang, J., et al., ACS Nano 7 (2013), p. 7145.Google Scholar
[7] Bangert, U., Pierce, W., Kepaptsoglou, D.M., et al., Nano Letters 13 (2013), p. 4902.Google Scholar
[8] Xu, Y., Zhang, K., Brüsewitz, C., et al., AIP Advances 3 (2013), p. 072120.Google Scholar
[9] SuperSTEM is the UK National Facility for Aberration-Corrected STEM and is funded by the UK Engineering and Physical Sciences Research Council(EPSRC).Google Scholar