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Electron-Beam Manipulated Nanoscale Reaction
Published online by Cambridge University Press: 05 August 2019
Abstract
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- Type
- In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
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- Copyright
- Copyright © Microscopy Society of America 2019
References
[3]Electron microscopy was performed in the Center for Nanoscale Materials, a U.S. Department of Energy Office of Science User Facility under Contract No. DE-AC02-06CH11357. H. Sheng and J. Wang acknowledge the financial support from the National Natural Science Foundation of China (51671148, 51271134, J1210061, 11674251, 51501132, 51601132), the Hubei Provincial Natural Science Foundation of China (2016CFB446, 2016CFB155), the Fundamental Research Funds for the Central Universities, and the CERS-1-26 (CERS-China Equipment and Education Resources System), and the China Postdoctoral Science Foundation (2014T70734), and the Open Research Fund of Science and Technology on High Strength Structural Materials Laboratory (Central South University) and the Suzhou Science and Technology project (No. SYG201619).Google Scholar
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