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Electron-beam Induced Interfacial Layer at Ni-BaTiO3 Interfaces of MLCC

Published online by Cambridge University Press:  05 August 2007

Y-J Yoon ,
Y-S Yu ,
C-H Kim  and
B-K Kim
Y-J Yoon
Affiliation:
Samsung Electro-Mechanics Co,Japan
Y-S Yu
Affiliation:
Samsung Electro-Mechanics Co,Japan
C-H Kim
Affiliation:
Samsung Electro-Mechanics Co,Japan
B-K Kim
Affiliation:
Samsung Electro-Mechanics Co,Japan
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 802 - 803
Copyright
© 2007 Microscopy Society of America

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