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Electron tomography using compositional-sensitive diffraction contrast for 3D characterization of self-assembled semiconductor quantum dots

Published online by Cambridge University Press:  03 August 2008

R Beanland ,
JC Hernandez ,
AM Sanchez  and
PA Midgley
R Beanland
Affiliation:
University of Cambridge, United Kingdom
JC Hernandez
Affiliation:
University of Cambridge, United Kingdom
AM Sanchez
Affiliation:
Universidad de Cadiz, Spain
PA Midgley
Affiliation:
University of Cambridge, United Kingdom
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1052 - 1053
Copyright
© 2008 Microscopy Society of America

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