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Electron Tomography Applied to an Indium Tin Oxide Nanowhisker

Published online by Cambridge University Press:  23 November 2012

P. Li ,
M. Kupsta ,
K. Cui ,
M. Malac ,
H. Hosseinkhannazer ,
Y. Ning ,
J. LaForge ,
A. Beaudry  and
M. Brett
P. Li
Affiliation:
National Institute for NanoTechnology, Edmonton, Alberta, Canada
M. Kupsta
Affiliation:
National Institute for NanoTechnology, Edmonton, Alberta, Canada
K. Cui
Affiliation:
National Institute for NanoTechnology, Edmonton, Alberta, Canada
M. Malac
Affiliation:
National Institute for NanoTechnology, Edmonton, Alberta, Canada
H. Hosseinkhannazer
Affiliation:
Norcada Inc., Edmonton, Alberta, Canada
Y. Ning
Affiliation:
Norcada Inc., Edmonton, Alberta, Canada
J. LaForge
Affiliation:
University of Alberta, Edmonton, Alberta, Canada
A. Beaudry
Affiliation:
University of Alberta, Edmonton, Alberta, Canada
M. Brett
Affiliation:
University of Alberta, Edmonton, Alberta, Canada
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 568 - 569
Copyright
Copyright © Microscopy Society of America 2012

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