Electron Tomographic Characterization of ErSi2 and GexSi1-x Nanoparticles Prepared by Doping of 4H-SiC

C Kuebel; U Kaiser

doi:10.1017/S1431927606064932

Electron Tomographic Characterization of ErSi2 and GexSi1-x Nanoparticles Prepared by Doping of 4H-SiC

Published online by Cambridge University Press: 31 July 2006

C Kuebel and

U Kaiser

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C Kuebel: Affiliation:
Fraunhofer Institute,Bremen
U Kaiser: Affiliation:
University of Ulm,Germany

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type: Abstract
Information: Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1546 - 1547

DOI: https://doi.org/10.1017/S1431927606064932 [Opens in a new window]

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Electron Tomographic Characterization of ErSi2 and GexSi1-x Nanoparticles Prepared by Doping of 4H-SiC

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