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Electron ptychography using an ultrafast direct electron detector

Published online by Cambridge University Press:  05 August 2019

Biying Song
Affiliation:
National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, People's Republic of China.
Zhiyuan Ding
Affiliation:
National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, People's Republic of China.
Christopher Allen
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK. Electron Physical Sciences Imaging Centre, Diamond Lightsource Ltd., Diamond House, OX11 0DE, U.K.
Hidetaka Sawada
Affiliation:
JEOL Ltd, 1-2 Mushashino, 3-Chome, Akishima, Tokyo 196, Japan.
Xiaoqing Pan
Affiliation:
Department of Chemical Engineering and Materials Science and Department of Physics and Astronomy, University of California, Irvine, CA 92697, USA.
Angus I. Kirkland
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK. Electron Physical Sciences Imaging Centre, Diamond Lightsource Ltd., Diamond House, OX11 0DE, U.K.
Peng Wang*
Affiliation:
National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, People's Republic of China.
*
*Corresponding author: [email protected]

Abstract

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Type
Advances in Phase Retrieval Microscopy
Copyright
Copyright © Microscopy Society of America 2019 

References

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[8]The authors acknowledge funding from the National Natural Science Foundation of China (11874199), and the National Basic Research Program of China, (Grant No. 2015CB654901).Google Scholar