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Electron Microscopy and Spectroscopy Characterization of the Effects of Annealing on the Cu/Graphene/Si Multilayer Thin Films

Published online by Cambridge University Press:  05 August 2019

Dibyesh Shrestha ,
Nicholas Ries ,
Otto Zietz ,
James Barnes ,
Andrea Goforth ,
Zhiqiang Chen  and
Jun Jiao
Dibyesh Shrestha
Affiliation:
Department Mechanical & Materials Engineering, Portland State University, Portland, Oregon 97207
Nicholas Ries
Affiliation:
Department Mechanical & Materials Engineering, Portland State University, Portland, Oregon 97207
Otto Zietz
Affiliation:
Department Mechanical & Materials Engineering, Portland State University, Portland, Oregon 97207
James Barnes
Affiliation:
Department of Chemistry, Portland State University, Portland, Oregon 97201
Andrea Goforth
Affiliation:
Department of Chemistry, Portland State University, Portland, Oregon 97201
Zhiqiang Chen
Affiliation:
Department Mechanical & Materials Engineering, Portland State University, Portland, Oregon 97207
Jun Jiao*
Affiliation:
Department Mechanical & Materials Engineering, Portland State University, Portland, Oregon 97207 Department of Chemistry, Portland State University, Portland, Oregon 97201
*
*[email protected]

Abstract

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Type
In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1918 - 1919
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Nguyen, B.S., Lin, J.F., Perng, D.C., Appl. Phys. Lett., Perng. 104, 082106 (2014)Google Scholar
[2] Hong, J., Lee, S., Lee, S., Han, H., Mahata, C., Yeon, H.W., Koo, B., Kim, S., Nam, T., Byun, K., Min, B.W, Kim, Y.W., Kim, H., Joo, Y.C., Lee, T.. Nanoscale. 6, 7503 (2014).Google Scholar
[3]The authors would like to thank Intel, Oregon Metal Initiative, and NSF under award No. ECS-1711994 for the supportGoogle Scholar