Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-26T15:17:49.720Z Has data issue: false hasContentIssue false
  • English
  • Français

Electron Microscopy Analysis of Interfaces in Oxides for Energy Applications

Published online by Cambridge University Press:  26 July 2009

JP Winterstein ,
C Wang  and
CB Carter
JP Winterstein
Affiliation:
University of Connecticut
C Wang
Affiliation:
University of Connecticut
CB Carter
Affiliation:
University of Connecticut

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1444 - 1445
Copyright
Copyright © Microscopy Society of America 2009