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Electron Exit Wave Reconstruction From a Single Defocused Image Using a Gaussian Basis

Published online by Cambridge University Press:  23 September 2015

Konstantin B. Borisenko
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, UK
Christopher S. Allen
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, UK
Jamie H. Warner
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, UK
Angus I. Kirkland
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, UK

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Coene, WMJ & Thust, A, M deBeeck and D VanDyck. Ultramicroscopy 64 (1996). p. 109.Google Scholar
[2] Hsieh, WK, Chen, FR, Kai, JJ & Kirkland, AI, Ultramicroscopy 98 (2004). p. 99.Google Scholar
[3] Barton, B, Jiang, B, Song, C, Specht, P, Calderon, H & Kisielowski, C, Microsc. Microanal. 18 (2012.Google Scholar
[4] Candes, EJ & Wakin, MB, IEEE Signal Proc. Mag. 25 (2008). p. 21.Google Scholar
[5] Financial support from the European Union under the Seventh Framework Program under a contract for an Integrated Infrastructure Initiative (Ref. 312483-ESTEEM2) is gratefully acknowledged..Google Scholar