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Electron Energy Loss Spectroscopy of Graphene Identified by Aberration, Corrected TEM at 300kV

Published online by Cambridge University Press:  26 July 2009

Y Abe ,
T Tanaka ,
H Sawada ,
E Okunishi ,
Y Kondo ,
Y Tanishiro  and
K Takayanagi
Y Abe
Affiliation:
Tokyo Institute of Technology,Japan
T Tanaka
Affiliation:
Tokyo Institute of Technology,Japan
H Sawada
Affiliation:
JEOL Ltd ,Japan
E Okunishi
Affiliation:
JEOL Ltd ,Japan
Y Kondo
Affiliation:
JEOL Ltd ,Japan
Y Tanishiro
Affiliation:
Tokyo Institute of Technology,Japan
K Takayanagi
Affiliation:
Tokyo Institute of Technology,Japan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1484 - 1485
Copyright
Copyright © Microscopy Society of America 2009