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Electron Channeling and Ion Channeling Contrast Imaging of Dislocations in Nitride Thin Films

Published online by Cambridge University Press:  03 August 2008

C Trager-Cowan ,
F Sweeney ,
PR Edwards ,
FL Dynowski ,
AJ Wilkinson ,
A Winkelmann ,
AP Day ,
T Wang ,
PJ Parbrook  and
IM Watson
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C Trager-Cowan
Affiliation:
University of Strathclyde, United Kingdom
F Sweeney
Affiliation:
University of Sheffield, United Kingdom
PR Edwards
Affiliation:
University of Strathclyde, United Kingdom
FL Dynowski
Affiliation:
University of Strathclyde, United Kingdom
AJ Wilkinson
Affiliation:
University of Oxford, United Kingdom
A Winkelmann
Affiliation:
Max-Planck-Institut für Mikrostrukturphysik, Germany
AP Day
Affiliation:
Aunt Daisy Scientific Ltd, United Kingdom
T Wang
Affiliation:
EPSRC National Centre for III-V Technologies, United Kingdom
PJ Parbrook
Affiliation:
EPSRC National Centre for III-V Technologies, United Kingdom
IM Watson
Affiliation:
University of Strathclyde, United Kingdom
DC Joy
Affiliation:
University of Tennessee"
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1194 - 1195
Copyright
© 2008 Microscopy Society of America

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