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Electron Backscatter Diffraction (EBSD) as a Predictive Tool for Amount of Cold Work in Ni-Based Welds and Base Materials

Published online by Cambridge University Press:  23 November 2012

M.A. Othon ,
M.M. Morra  and
W. Eric
M.A. Othon
Affiliation:
Micro and Nano Analysis Laboratory, GE Global Research, Niskayuna, NY
M.M. Morra
Affiliation:
Micro and Nano Analysis Laboratory, GE Global Research, Niskayuna, NY
W. Eric
Affiliation:
Electric Power Research Institute, Palo Alto, CA
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1768 - 1769
Copyright
Copyright © Microscopy Society of America 2012

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