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Electrochemical Mass Spectroscopy for In-situ Liquid Phase Electron Microscopy

Published online by Cambridge University Press:  22 July 2022

Hongyu Sun ,
Johannes Novak Hartmann ,
Ronald Spruit ,
Yevheniy Pivak ,
Daniel Trimarco  and
H. Hugo Pérez Garza
Hongyu Sun*
Affiliation:
DENSsolutions B.V., Informaticalaan 12, Delft, The Netherlands
Johannes Novak Hartmann
Affiliation:
Spectro Inlets ApS, Ole Maaløes Vej 3, København, Denmark
Ronald Spruit
Affiliation:
DENSsolutions B.V., Informaticalaan 12, Delft, The Netherlands
Yevheniy Pivak
Affiliation:
DENSsolutions B.V., Informaticalaan 12, Delft, The Netherlands
Daniel Trimarco*
Affiliation:
Spectro Inlets ApS, Ole Maaløes Vej 3, København, Denmark
H. Hugo Pérez Garza*
Affiliation:
DENSsolutions B.V., Informaticalaan 12, Delft, The Netherlands
*
*Corresponding author: [email protected] (H. Sun), [email protected] (D. Trimarco), [email protected] (H. Pérez Garza)
*Corresponding author: [email protected] (H. Sun), [email protected] (D. Trimarco), [email protected] (H. Pérez Garza)
*Corresponding author: [email protected] (H. Sun), [email protected] (D. Trimarco), [email protected] (H. Pérez Garza)

Abstract

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Type
On Demand - In Situ TEM Characterization of Dynamic Processes During Materials Synthesis And Processing
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 1946 - 1947
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Copyright
Copyright © Microscopy Society of America 2022

References

Seh, ZW, et al. Science 355 (2017), p. eaad4998.10.1126/science.aad4998CrossRefGoogle Scholar
Xia, YN, et al. Angew. Chem. Int. Ed. 48 (2009), p. 60.10.1002/anie.200802248CrossRefGoogle Scholar
Ross, FM, Science 350 (2015), p. aaa9886.10.1126/science.aaa9886CrossRefGoogle Scholar
Pan, Y, et al. Curr. Opin. Electrochem. 33 (2022), p. 100936.10.1016/j.coelec.2022.100936CrossRefGoogle Scholar
Trimarco, DB, et al. Electrochim. Acta 268 (2018), p. 520e530.10.1016/j.electacta.2018.02.060CrossRefGoogle Scholar
Beker, AF, et al. Nanoscale 12 (2020), p. 22192.10.1039/D0NR04961ACrossRefGoogle Scholar
van Omme, JT, et al. J. Mater. Chem. C 8 (2020), p. 10781.Google Scholar
This work is partly financed by the WBSO program of the Netherlands, which encourages firms to spend time on research and development activities.Google Scholar