Hostname: page-component-586b7cd67f-gb8f7 Total loading time: 0 Render date: 2024-11-29T17:27:15.789Z Has data issue: false hasContentIssue false
  • English
  • Français

Effects of Higher-Order Laue Zone Reflections on Atomic Resolution TEM Images of Single Layer and Bilayer Graphene

Published online by Cambridge University Press:  01 August 2010

HS Kim
HS Kim
Affiliation:
Kyungsung University, Korea

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 274 - 275
Copyright
Copyright © Microscopy Society of America 2010