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Effect of substrate morphology on stress-tested GaN-on-GaN vertical p-n diodes

Published online by Cambridge University Press:  30 July 2021

Prudhvi Ram peri ,
Kai Fu ,
Houqiang Fu ,
Yuji Zhao  and
David J Smith
Prudhvi Ram peri
Affiliation:
Arizona State University, tempe, Arizona, United States
Kai Fu
Affiliation:
arizona state university, United States
Houqiang Fu
Affiliation:
Arizona State University, United States
Yuji Zhao
Affiliation:
Arizona State University, United States
David J Smith
Affiliation:
Arizona State University, 85281, Arizona, United States

Abstract

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Type
Defects in Materials: How We See and Understand Them
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1760 - 1761
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Peri, P., Fu, K., Fu, H., Zhao, Y., and Smith, D. J., J. Electron. Mater. (2021).Google Scholar
Peri, P., Fu, K., Fu, H., Zhao, Y., and Smith, D. J., J. Vac. Sci. Technol. A 38, 063402 (2020).Google Scholar