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Effect of Induced Stimuli on the Leakage Current of Operative Oxide-based Devices inside a TEM

Published online by Cambridge University Press:  22 July 2022

Oscar Recalde ,
Tianshu Jiang ,
Robert Eilhardt ,
Alexander Zintler ,
Yating Ruan ,
Alexey Arzumanov ,
Tijn van Omme ,
Gin Pivak ,
Hector H. Perez-Garza  and
Philipp Komissinskiy
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Oscar Recalde
Affiliation:
Advanced Electron Microscopy Division, Department of Materials- and Earth Science, Technical University of Darmstadt, Darmstadt, Hessen, Germany
Tianshu Jiang
Affiliation:
Advanced Electron Microscopy Division, Department of Materials- and Earth Science, Technical University of Darmstadt, Darmstadt, Hessen, Germany
Robert Eilhardt
Affiliation:
Advanced Electron Microscopy Division, Department of Materials- and Earth Science, Technical University of Darmstadt, Darmstadt, Hessen, Germany
Alexander Zintler
Affiliation:
Advanced Electron Microscopy Division, Department of Materials- and Earth Science, Technical University of Darmstadt, Darmstadt, Hessen, Germany
Yating Ruan
Affiliation:
Advanced Thin Film Technology Division, Department of Materials- and Earth Science, Technical University of Darmstadt, Darmstadt, Hessen, Germany
Alexey Arzumanov
Affiliation:
Advanced Thin Film Technology Division, Department of Materials- and Earth Science, Technical University of Darmstadt, Darmstadt, Hessen, Germany
Tijn van Omme
Affiliation:
DENSsolutions, Delft, Netherlands
Gin Pivak
Affiliation:
DENSsolutions, Delft, Netherlands
Hector H. Perez-Garza
Affiliation:
DENSsolutions, Delft, Netherlands
Philipp Komissinskiy
Affiliation:
Advanced Thin Film Technology Division, Department of Materials- and Earth Science, Technical University of Darmstadt, Darmstadt, Hessen, Germany
Lambert Alff
Affiliation:
Advanced Thin Film Technology Division, Department of Materials- and Earth Science, Technical University of Darmstadt, Darmstadt, Hessen, Germany
Leopoldo Molina-Luna*
Affiliation:
Advanced Electron Microscopy Division, Department of Materials- and Earth Science, Technical University of Darmstadt, Darmstadt, Hessen, Germany
*
*Corresponding author: [email protected]

Abstract

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Type
From Operando Microcell Experiments to Bulk Devices
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 820 - 821
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Copyright
Copyright © Microscopy Society of America 2022

References

Molina-Luna, L et al. , Nature Communications 9(1) (2018), p. 4445. doi: 10.1038/s41467-018-06959-8CrossRefGoogle Scholar
Zhang, Q et al. , Nature Communications 8(1) (2017), p. 104. doi: 10.1038/s41467-017-00121-6CrossRefGoogle Scholar
Nukala, P et al. , Science 372(6542) (2021), p. 630. doi: 10.1126/science.abf3789CrossRefGoogle Scholar
Sato, Y et al. , Applied Physics Letters 111(6) (2017), p. 062904. doi: 10.1063/1.4986361CrossRefGoogle Scholar