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EDS Quantification Using Fe L Peaks and Low Beam Energy

Published online by Cambridge University Press:  30 July 2021

Jens Rafaelsen ,
Frank Eggert  and
Masanobu Kawabata
Jens Rafaelsen
Affiliation:
Ametek / EDAX LLC, Mahwah, New Jersey, United States
Frank Eggert
Affiliation:
Ametek / EDAX LLC, Mahwah, New Jersey, United States
Masanobu Kawabata
Affiliation:
AMETEK / EDAX LLC, United States

Abstract

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Type
Unresolved Challenges in Quantitative X-ray Microanalysis
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1670 - 1672
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Trincavelli, J., Limandri, S. and Bonetto, R., “Standardless quantification methods in electron probe microanalysis,” Spectrochimica Acta Part B, vol. 101, pp. 76-85, 2014.CrossRefGoogle Scholar
Newbury, D. E. and Ritchie, N. W. M., “Electron-Excited X-Ray Microanalysis at Low Beam Energy: Almost Always an Adventure!,” Microsc. Microanal., vol. 22, pp. 735-753, 2016.CrossRefGoogle ScholarPubMed
Newbury, D. and Ritchie, N., “Quantitative Electron-excited X-ray Microanalysis with Low Energy L-Peaks,” Microsc. Microanal., vol. 26, pp. 44-49, 2020.CrossRefGoogle Scholar
Eggert, F., “Effect of the Silicon Drift Detector on EDAX Standardless Quant Methods,” Microscopy Today, no. March, pp. 34-39, 2020.Google Scholar
Gopon, P., Fournelle, J., Sobol, P. E. and Llovet, X., “Low-Voltage Electron-Probe Microanalysis of Fe–Si Compounds Using Soft X-Rays,” Microsc. Microanal., vol. 19, p. 1698–1708, 2013.Google Scholar