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EBSD Image Quality Mapping

Published online by Cambridge University Press:  09 December 2005

Stuart I. Wright  and
Matthew M. Nowell
Stuart I. Wright
Affiliation:
EDAX-TSL, 392 East 12300 South, Draper, Utah 84020, USA
Matthew M. Nowell
Affiliation:
EDAX-TSL, 392 East 12300 South, Draper, Utah 84020, USA
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Abstract

Image quality (IQ) maps constructed from electron backscatter diffraction data provide useful visualizations of microstructure. The contrast in these maps arises from a variety of sources, including phase, strain, topography, and grain boundaries. IQ maps constructed using various IQ metrics are compared to identify the most prominent contrast mechanism for each metric. The conventional IQ metric was found to provide the superior grain boundary and strain contrast, whereas an IQ metric based on the average overall intensity of the diffraction patterns was found to provide better topological and phase contrast.

Keywords

electron backscatter diffractionEBSDorientation imaging microscopyOIMimage qualityIQ
Type
MICROANALYSIS
Information
Microscopy and Microanalysis , Volume 12 , Issue 1 , February 2006 , pp. 72 - 84
Copyright
2006 Microscopy Society of America

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References

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