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EBSD Characterization of Microstructural Variations in Solid-State Welds as a Function of Distance from the Weld Interface in Ti-17

Published online by Cambridge University Press:  23 September 2015

Jonathan Orsborn ,
Thomas F. Broderick  and
Hamish Fraser
Jonathan Orsborn
Affiliation:
Center for the Accelerated Maturation of Materials, Department of Materials Science and Engineering, The Ohio State University, Columbus, OH Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH
Thomas F. Broderick
Affiliation:
GE Aviation, Materials and Process Engineering, One Neumann Way, Cincinnati, OH
Hamish Fraser
Affiliation:
Center for the Accelerated Maturation of Materials, Department of Materials Science and Engineering, The Ohio State University, Columbus, OH

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2423 - 2424
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Attallah, M. M., et al., Metallurgical and. Materials Transactions A 43 (2012). p. 3149–3161.CrossRefGoogle Scholar
[2] Lutjering, G. G. and J.C. Williams in "Titanium" ((Springer, Berlin).Google Scholar
[3] George, F. Vander Voort in. "Metallography: Principles and Practice" ((McGraw-Hill, New York).Google Scholar