Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-27T07:44:10.382Z Has data issue: false hasContentIssue false
  • English
  • Français

EBSD Analysis of Materials Utilizing High Temperature Protochips Aduro System in FE-SEM

Published online by Cambridge University Press:  09 October 2013

N. Erdman ,
M. Shibata ,
D. Gardiner  and
B. Jacobs
N. Erdman
Affiliation:
M. Shibata
Affiliation:
D. Gardiner
Affiliation:
B. Jacobs
Affiliation:

Abstract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 740 - 741
Copyright
Copyright © Microscopy Society of America 2013