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Ease of Use Solution for Fast and Automated TEM-Lamella Preparation

Published online by Cambridge University Press:  23 September 2015

Tobias Volkenandt ,
Giuseppe Pavia ,
Ingo Schulmeyer  and
Martin Kienle
Tobias Volkenandt
Affiliation:
Carl Zeiss Microscopy GmbH, Oberkochen, Germany
Giuseppe Pavia
Affiliation:
Carl Zeiss Microscopy GmbH, Oberkochen, Germany
Ingo Schulmeyer
Affiliation:
Carl Zeiss Microscopy GmbH, Oberkochen, Germany
Martin Kienle
Affiliation:
Carl Zeiss Microscopy GmbH, Oberkochen, Germany

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 163 - 164
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Giannuzzi, LA & Stevie, FA, Micron 30 (1999). p. 197.CrossRefGoogle Scholar
[2] Salzer, R & Lechner, L, Microscopy and Microanalysis 18 (2012). p. 654.CrossRefGoogle Scholar