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Dynamic Nanoimpedance Characterization of the Atomic Force Microscope Tip-Surface Contact

Published online by Cambridge University Press:  13 December 2013

Mateusz Tomasz Tobiszewski ,
Artur Zieliński  and
Kazimierz Darowicki
Mateusz Tomasz Tobiszewski*
Affiliation:
Department of Electrochemistry, Corrosion and Materials Engineering, Gdańsk University of Technology, Narutowicza 11/12, 80-233 Gdańsk, Poland
Artur Zieliński
Affiliation:
Department of Electrochemistry, Corrosion and Materials Engineering, Gdańsk University of Technology, Narutowicza 11/12, 80-233 Gdańsk, Poland
Kazimierz Darowicki
Affiliation:
Department of Electrochemistry, Corrosion and Materials Engineering, Gdańsk University of Technology, Narutowicza 11/12, 80-233 Gdańsk, Poland
*
*Corresponding author. E-mail: [email protected]
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Abstract

Nanoimpedance measurements, using the dynamic impedance spectroscopy technique, were carried out during loading and unloading force of a probe on three kinds of materials of different resistivity. These materials were: gold, boron-doped diamond, and AISI 304 stainless steel. Changes of impedance spectra versus applied force were registered and differences in the tip-to-sample contact character on each material were revealed. To enable comparison between materials and phases, a new standardization method is proposed, which simulates conditions of initial contact.

Keywords

AFMSPMDEISnanoimpedanceimpedancenanocontact
Type
Techniques, Software, and Instrumentation Development
Information
Microscopy and Microanalysis , Volume 20 , Issue 1 , February 2014 , pp. 72 - 77
Copyright
Copyright © Microscopy Society of America 2014 

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