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Dynamic Electron and X-ray Imaging is a Moving Experience

Published online by Cambridge University Press:  30 July 2021

Simon Burgess
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, England, United Kingdom
Haithem Mansour
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, England, United Kingdom
Anthony Hyde
Affiliation:
Oxford Instruments, England, United Kingdom
Philippe Pinard
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, United Kingdom
Peter Statham
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, United Kingdom
Christian Lang
Affiliation:
Oxford Instruments Nanoanalysis, High Wycombe, England, United Kingdom
Michael Hjelmstad
Affiliation:
Oxford Instruments Inc, Pleasanton, California, United States

Abstract

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Type
Vendor Symposium
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Pinard, P. et al. Microsc. Microanal. 24 S1 (2018), p. 624.CrossRefGoogle Scholar
Hyde, A. et al. Microsc. Microanal. 25 S2 (2019), p, 1276CrossRefGoogle Scholar