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Distinguishability of Structures via Principal Component Analysis: Application to 4D STEM

Published online by Cambridge University Press:  05 August 2019

Mark P. Oxley ,
Sergei V. Kalinin  and
Rama K. Vasudevan
Mark P. Oxley
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN, USA. Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge TN, USA.
Sergei V. Kalinin
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN, USA. Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge TN, USA.
Rama K. Vasudevan*
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN, USA. Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge TN, USA.
*
*Corresponding author: [email protected]

Abstract

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Type
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 126 - 127
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Morely, G et al. , Nat. Mater. 9 (2010), p. 725.Google Scholar
[2]Midgley, P and Thomas, J, Angewandte Chem. 53 (2014), p. 8614.Google Scholar
[3]This work was supported by the U.S. Department of Energy, Office of Science, Materials Sciences and Engineering Division (MPO, SVK, RKV). Research was conducted at the Center for Nanophase Materials Sciences, which is a US DOE Office of Science User Facility.Google Scholar