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Dislocation imaging via the virtual dark-field technique using the precession electron diffraction data

Published online by Cambridge University Press:  30 July 2021

Dexin Zhao  and
Kelvin Xie
Dexin Zhao
Affiliation:
Texas A & M University, United States
Kelvin Xie
Affiliation:
Texas A & M University, United States

Abstract

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Type
Defects in Materials: How We See and Understand Them
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2916 - 2917
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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