Hostname: page-component-7479d7b7d-qlrfm Total loading time: 0 Render date: 2024-07-15T23:00:08.489Z Has data issue: false hasContentIssue false
  • English
  • Français

Direct Observation of Conducting Paths in TiO2 Thin Film by Transmission Electron Microscopy

Published online by Cambridge University Press:  26 July 2009

DH Kwon ,
J-M Jeon ,
JH Jang ,
KM Kim ,
CS Hwang  and
M Kim
DH Kwon
Affiliation:
Seoul National University,Korea
J-M Jeon
Affiliation:
Seoul National University,Korea
JH Jang
Affiliation:
Seoul National University,Korea
KM Kim
Affiliation:
Seoul National University,Korea
CS Hwang
Affiliation:
Seoul National University,Korea
M Kim
Affiliation:
Seoul National University,Korea

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 996 - 997
Copyright
Copyright © Microscopy Society of America 2009