Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-23T18:02:27.995Z Has data issue: false hasContentIssue false
  • English
  • Français

Direct Measurement of Atom Diffusion Using Atom-Tracking STM

Published online by Cambridge University Press:  31 July 2003

B. S. Swartzentruber ,
R. Stumpf ,
T. R. Mattsson  and
P. J. Feibelman
B. S. Swartzentruber
Affiliation:
Sandia National Laboratories, PO Box 5800, Albuquerque, NM 87185-1415
R. Stumpf
Affiliation:
Sandia National Laboratories, PO Box 5800, Albuquerque, NM 87185-1415
T. R. Mattsson
Affiliation:
Sandia National Laboratories, PO Box 5800, Albuquerque, NM 87185-1415
P. J. Feibelman
Affiliation:
Sandia National Laboratories, PO Box 5800, Albuquerque, NM 87185-1415

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 908 - 909
Copyright
Copyright © Microscopy Society of America 2003