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Direct Lattice Parameter Measurements Using HAADF-STEM

Published online by Cambridge University Press:  27 August 2014

Adedapo A. Oni ,
Xiahan Sang ,
Aakash Kumar ,
Selva V. Raju ,
Srikant Srinivasan ,
Susan Sinnott ,
Surendra Saxena ,
Krishna Rajan  and
James M. LeBeau
Adedapo A. Oni
Affiliation:
North Carolina State University, Materials Science and Engineering, Raleigh, USA
Xiahan Sang
Affiliation:
North Carolina State University, Materials Science and Engineering, Raleigh, USA
Aakash Kumar
Affiliation:
University of Florida, Materials Science and Engineering, Gainsville, USA
Selva V. Raju
Affiliation:
Florida International University, Mechanical and Materials Engineering, Miami, USA
Srikant Srinivasan
Affiliation:
Iowa State University, Materials Science and Engineering, Ames, USA
Susan Sinnott
Affiliation:
University of Florida, Materials Science and Engineering, Gainsville, USA
Surendra Saxena
Affiliation:
Florida International University, Mechanical and Materials Engineering, Miami, USA
Krishna Rajan
Affiliation:
Iowa State University, Materials Science and Engineering, Ames, USA
James M. LeBeau
Affiliation:
North Carolina State University, Materials Science and Engineering, Raleigh, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1050 - 1051
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Reed, RC in “The superalloys: Fundamentals and Applications”, (Cambridge University Press, Cambridge).Google Scholar
[2] Sang, X and LeBeau, JM Ultramicroscopy 138 (2014) 28-35.Google Scholar
[3] Wu, Q and Li, S Computational Materials Science 53 (2012) 436-443.Google Scholar
[4] Mishima, Y, et al., Acta Metall. 33 (1985) 1161-1169.Google Scholar
[5] The authors acknowledge support from the Air Force Office of Scientific Research (Grant No. FA9550-12-1-0456).Google Scholar