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Direct imaging of GaN Pyramids covered by InGaN Single Quantum Well using nano-scale Scanning Transmission Electron Microscopy Cathodoluminescence

Published online by Cambridge University Press:  23 November 2012

M. Müller
Affiliation:
Otto-von-Guericke-University, Magdeburg, Germany
G. Schmidt
Affiliation:
Otto-von-Guericke-University, Magdeburg, Germany
S. Metzner
Affiliation:
Otto-von-Guericke-University, Magdeburg, Germany
F. Bertram
Affiliation:
Otto-von-Guericke-University, Magdeburg, Germany
S. Petzold
Affiliation:
Otto-von-Guericke-University, Magdeburg, Germany
P. Veit
Affiliation:
Otto-von-Guericke-University, Magdeburg, Germany
J. Christen
Affiliation:
Otto-von-Guericke-University, Magdeburg, Germany
C. Wächter
Affiliation:
Institut für Halbleiteroptik und Funktionelle Grenzflächen, Stuttgart, Germany
M. Jetter
Affiliation:
Institut für Halbleiteroptik und Funktionelle Grenzflächen, Stuttgart, Germany
P. Michler
Affiliation:
Institut für Halbleiteroptik und Funktionelle Grenzflächen, Stuttgart, Germany
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 2012

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