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Direct Comparison of Various Gaseous Secondary Electron Detectors in the Variable Pressure Scanning Electron Microscope

Published online by Cambridge University Press:  01 August 2005

M R Phillips  and
S W Morgan
M R Phillips
Affiliation:
University of Technology,Sydney
S W Morgan
Affiliation:
University of Technology,Sydney

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 398 - 399
Copyright
© 2005 Microscopy Society of America