Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-26T21:24:55.950Z Has data issue: false hasContentIssue false
  • English
  • Français

Direct atomistic defect observations by depth sectioning and dynamic STEM

Published online by Cambridge University Press:  30 July 2021

Ryo Ishikawa ,
Naoya Shibata  and
Yuichi Ikuhara
Ryo Ishikawa
Affiliation:
Institute of Engineering Innovation, University of Tokyo, Tokyo, Japan
Naoya Shibata
Affiliation:
Institute of Engineering Innovation, University of Tokyo, United States
Yuichi Ikuhara
Affiliation:
Institute of Engineering Innovation, University of Tokyo, Tokyo, Japan

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Defects in Materials: How We See and Understand Them
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2138 - 2139
Check for updates
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Morishita, S. et al. , Microscopy 67 46 (2018).Google Scholar
Ishikawa, R. et al. , Phys. Rev. Appl. 13 034064 (2020).CrossRefGoogle Scholar
Ishikawa, R. et al. , Microscopy 69 240 (2020).CrossRefGoogle Scholar
Ishikawa, R. et al. , Ultramicroscopy 222 133215 (2021).Google Scholar
This work was partly supported by NEDO-RISING2 project (JPNP16001).Google Scholar