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Digital Image Correlation of Heterogeneous Deformation in Polycrystalline Material with Electron Backscatter Diffraction

Published online by Cambridge University Press:  23 September 2015

Javier Esquivel  and
Michael D. Sangid
Javier Esquivel
Affiliation:
Purdue University, School of Aeronautics and Astronautics, West Lafayette, IN, USA.
Michael D. Sangid
Affiliation:
Purdue University, School of Aeronautics and Astronautics, West Lafayette, IN, USA.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1167 - 1168
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Abuziad, W., Sangid, M.D., Carroll, J., Sehitoglu, H. & Lambros, J., Journal of the Mechanics and Physics of Solids 60 (2012), p 1201–1220.CrossRefGoogle Scholar
[2] Kammers, A.D. & Daly, S., Experimental Mechanics 53 (2013), p 1743–1761.CrossRefGoogle Scholar
[3] Di Gioacchino, F. & Quinta da Fonseca, J., Experimental Mechanics 53 (2013), p 743–754.CrossRefGoogle Scholar
[4] Kammers, A.D. & Daly, S., Experimental Mechanics 53 (2013), p 1333–1341.Google Scholar
[5] The authors gratefully acknowledge German A. Parada for initial set-up of the speckle pattern procedure during undergraduate research at Purdue. The authors graciously acknowledge support for this work from Rolls-Royce Corporation and the National Science Foundation, CMMI-1334664. Prof. Daly is thanked for providing stimulating discussions and suggestions for the SEM-DIC methodology.Google Scholar