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Digital Field Ion Microscopy

Published online by Cambridge University Press:  02 July 2020

S. J. Sijbrandij ,
K. F. Russell ,
R. C. Thomson  and
M. K. Miller
S. J. Sijbrandij
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6376, USA
K. F. Russell
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6376, USA
R. C. Thomson
Affiliation:
Institute of Polymer Technology and Materials Engineering, Loughborough University, Loughborough, LE11 3TU, UK
M. K. Miller
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6376, USA
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Extract

Due to environmental concerns, there is a trend to avoid the use of chemicals needed to develop negatives and to process photographic paper, and to use digital technologies instead. Digital technology also offers the advantages that it is convenient, as it enables quick access to the endresult, allows image storage and processing on computer, allows rapid hard copy output, and simplifies electronic publishing. Recently significant improvements have been made to the performance and cost of camera-sensors and printers. In this paper, field ion images recorded with two digital cameras of different resolution are compared to images recorded on standard 35 mm negative film. It should be noted that field ion images exhibit low light intensity and high contrast.

Field ion images were recorded from a standard microchannel plate and a phosphor screen and had acceptance angles of ∼60°.

Type
Imaging and Analysis at the Atomic Level: 30 Years of Atom Probe Field Ion Microscopy
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 88 - 89
Copyright
Copyright © Microscopy Society of America

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References

1 This research was conducted using the SHaRE Facilities at Oak Ridge National Laboratory (ORNL) and was sponsored by the Division of Materials Sciences, U.S. Department of Energy, under contract DE-AC05-960R22464 with Lockheed Martin Energy Research Corp. and by an appointment to the ORNL Postdoctoral Research Associates Program administered jointly by the Oak Ridge Institute for Science and Education and ORNL.