Hostname: page-component-586b7cd67f-gb8f7 Total loading time: 0 Render date: 2024-11-26T18:30:34.498Z Has data issue: false hasContentIssue false
  • English
  • Français

Diffraction contrast analysis of dislocations in 2D materials using true dark-field and 4D-STEM in SEM

Published online by Cambridge University Press:  30 July 2021

Peter Denninger ,
Peter Schweizer ,
Christian Dolle  and
Erdmann Spiecker
Peter Denninger
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Interdisciplinary Center for Nanostructured Films (IZNF), Department of Materials Science and Engineering, Friedrich-Alexander University Erlangen-Nürnberg (FAU), Erlangen, Germany, Erlangen, Bayern, Germany
Peter Schweizer
Affiliation:
Empa, Thun, Switzerland
Christian Dolle
Affiliation:
Karlsruher Institut für Technologie, Karlsruhe, Baden-Wurttemberg, Germany
Erdmann Spiecker
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Interdisciplinary Center for Nanostructured Films (IZNF), Department of Materials Science and Engineering, Friedrich-Alexander University Erlangen-Nürnberg (FAU), Erlangen, Germany, Erlangen, Bayern, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Analytical STEM-in-SEM
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1816 - 1819
Check for updates
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Sun, C., Muller, E., Meffert, M., Gerthsen, D., Analysis of crystal defects by scanning transmission electron microscopy (STEM) in a modern scanning electron microscope, Adv. Struct. Chem. Imaging 5 (2019) 1.CrossRefGoogle Scholar
Caplins, B.W., Holm, J.D., Keller, R.R., Transmission imaging with a programmable detector in a scanning electron microscope, Ultramicroscopy 196 (2019) 40-48.Google Scholar
Schweizer, P., Denninger, P., Dolle, C., Spiecker, E., Low energy nano diffraction (LEND) – A versatile diffraction technique in SEM, Ultramicroscopy 213 (2020) 112956.Google ScholarPubMed
Schweizer, P., Dolle, C., Spiecker, E., In situ manipulation and switching of dislocations in bilayer graphene, Science Advances 4 (2018), p. eaat4712P.CrossRefGoogle ScholarPubMed
Ophus, C., Ercius, P., Sarahan, M., Czarnik, C., Ciston, J., Recording and using 4D-STEM datasets in materials science, Microsc. Microanal. 20 (2014) 62-63.CrossRefGoogle Scholar
We gratefully acknowledge financial support by the German Research Foundation (DFG) within the frameworks of the research training group GRK1896 “In situ Microscopy with Electrons, X-rays and Scanning Probes” and the Collaborative Research Centre 953 “Synthetic C-allotropes”.Google Scholar