Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-11-25T20:09:47.743Z Has data issue: false hasContentIssue false
  • English
  • Français

Differential Electron Scattering Cross-Section at Low Electron Energies: The Influence of the Screening Parameter

Published online by Cambridge University Press:  05 August 2019

Martin Čalkovský ,
Milena Hugenschmidt ,
Erich Müller  and
Dagmar Gerthsen
Martin Čalkovský
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany.
Milena Hugenschmidt
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany.
Erich Müller
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany.
Dagmar Gerthsen
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Low Voltage, Low Energy Electron Microscopy Imaging and Analysis
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 464 - 465
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Klein, M.F.G. et al. , J. Polym. Sci. B Polym. Phys. 50 (2012), p. 198.Google Scholar
[2]Demers, H. et al. , Scanning 33 (2011), p. 135.Google Scholar
[3]Volkenandt, T. et al. , Microsc. Microanal. 111 (2014) p.20.Google Scholar
[4]Ritchie, N.W.M., Surf. Interface Anal. 37 (2005), p. 1006.Google Scholar
[5]Moliere, G., Zeitschrift für Naturforschung A 2 (1947), p. 133.Google Scholar
[6]Kyriakou, I., J. Appl. Phys. 113 (2013), p. 084303.Google Scholar
[7]We are grateful for funding by the Deutsche Forschungsgemeinschaft (DFG).Google Scholar