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A Different Kind of Microscopy: Analyzing Features with an Automated Electron Beam

Published online by Cambridge University Press:  31 July 2006

F Schamber  and
CK van Beek
F Schamber
Affiliation:
Aspex Corporation
CK van Beek
Affiliation:
Aspex Corporation

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1782 - 1783
Copyright
© 2006 Microscopy Society of America