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Development of Sample-Scanning Electron Holography

Published online by Cambridge University Press:  09 April 2017

M Takeguchi ,
K Mitsuishi ,
D Lei  and
M Shimojo
M Takeguchi
Affiliation:
National Institute for Materials Science, Japan
K Mitsuishi
Affiliation:
National Institute for Materials Science, Japan
D Lei
Affiliation:
Saitama Institute of Technology, Japan
M Shimojo
Affiliation:
Saitama Institute of Technology, Japan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1230 - 1231
Copyright
Copyright © Microscopy Society of America 2011