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Development of Diffraction Scanning Techniques for Beam Sensitive Polymers.

Published online by Cambridge University Press:  25 July 2016

Karen C. Bustillo ,
Ouliana Panova ,
Christoph Gammer ,
Edward B. Trigg ,
X. Chelsea Chen ,
Lu Yan ,
Nitash P. Balsara ,
Karen I. Winey  and
Andrew M. Minor
Karen C. Bustillo
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, and
Ouliana Panova
Affiliation:
Department of Materials Science and Engineering and
Christoph Gammer
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, and Department of Materials Science and Engineering and
Edward B. Trigg
Affiliation:
Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, PA, USA
X. Chelsea Chen
Affiliation:
Materials Sciences Division; Lawrence Berkeley National Laboratory, Berkeley, CA, USA.
Lu Yan
Affiliation:
Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, PA, USA
Nitash P. Balsara
Affiliation:
Materials Sciences Division; Lawrence Berkeley National Laboratory, Berkeley, CA, USA. Department of Chemical and Biomolecular Engineering, University of California, Berkeley, CA, USA.
Karen I. Winey
Affiliation:
Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, PA, USA
Andrew M. Minor
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, and Department of Materials Science and Engineering and

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 492 - 493
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Gammer, C, et al, Ultramicroscopy 155 (2015). p. 1.CrossRefGoogle Scholar
[2] Buitrago, CF, et al, Macromolecules 46 (2013). p. 9003.CrossRefGoogle Scholar
[3] Panova, O., et al, to be submitted.Google Scholar
[4] Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231. OP, XCC, NPB and AMM acknowledge the Electron Microscopy of Soft Matter Program from the Office of Science, Office of Basic Energy Sciences, Materials Sciences and Engineering Division of the U. S. Department of Energy under Contract No. DE-AC02-05CH11231. KIW, EBT and LY acknowledge support from the Miller Institute at the University of California Berkeley, NSF DMR (1506726) and ARO (W911NF-13-1-0363).Google Scholar