Development of Atom Probe Tomography with In-situ STEM Imaging and Diffraction

B Gorman; J Shepard; R Kirchhofer; J Olson; T Kelly

doi:10.1017/S1431927611004429

Development of Atom Probe Tomography with In-situ STEM Imaging and Diffraction

Published online by Cambridge University Press: 09 April 2017

B Gorman ,

J Shepard ,

R Kirchhofer ,

J Olson and

T Kelly

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B Gorman: Affiliation:
Colorado School of Mines
J Shepard: Affiliation:
Cameca Instruments, Inc
R Kirchhofer: Affiliation:
Colorado School of Mines
J Olson: Affiliation:
Cameca Instruments, Inc
T Kelly: Affiliation:
Cameca Instruments, Inc

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type: Abstract
Information: Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 710 - 711

DOI: https://doi.org/10.1017/S1431927611004429 [Opens in a new window]

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Development of Atom Probe Tomography with In-situ STEM Imaging and Diffraction

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